| Open / Short |
200 Ω to 50 KΩ |
| Instant On-Resistance Test |
50 mΩ to 10 Ω ON |
| Resistance Test (COND) |
50 mΩ to 500 Ω |
| Resistance Measurement (R) |
0.1 Ω to 10 MΩ |
| Capacitance Measurement (C) |
10 pF to 1000 μF |
| Diode Measurement (D) |
0.0 V to 7.0 V |
| Insulation Resistance (I.S) |
1 MΩ to 1000 MΩ |
| DC Leakage Current (IL) |
0.1 μA to 1000 μA |
| High Voltage Leakage Current (IL) |
0.1 mA to 10 mA |
| Basic Accuracy |
±1% |
| Test Scan Mode |
Auto / Manual Scan |
| Measurement Speed |
0.1 sec basic value |
| Measuring Frequency / Signal Voltage |
100 to 100 KHz, 1 VAC |
| Low Voltage Measurement Signal |
5 VDC, 50 mA (Accuracy: ±0.5%) |
| High Voltage Leakage Test |
100 to 700 VACS |
| High Voltage Insulation Test |
5 V to 1000 VDC |
| Test Points |
64 pin / 128 pin |
| Memory Device |
512 KB RAM |
